| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Characterizing Residual Stress Gradients Due to Shot Peening: Comparison Between X-ray and Nanoindentation Techniques |
| Author(s) |
Siavash Ghanbari, David F. Bahr |
| On-Site Speaker (Planned) |
David F. Bahr |
| Abstract Scope |
Residual stresses generated during surface enhancement processing form gradients that can be probed via a variety of techniques. We develop a model-based analysis of the impact of residual stresses in metals on nanoindentation load-depth curves. A shot peened high strength steel was used as an experimental validation benchmark, with surface residual stresses characterized with a “cosine alpha” method x-ray detection system and compared directly to those determined via nanoindentation. The lateral sensitivity of the indentation method was demonstrated to be on the order of 10 micrometers, with a lower limit determined by a combination of the surface roughness and ensuring the tip is fully within the self-similar geometry. The indentation method shows more point to point variation than the 2 mm spot size x-ray technique, but the average does converge to the x-ray method value. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |