| About this Abstract |
| Meeting |
2023 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2023)
|
| Symposium
|
2023 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2023)
|
| Presentation Title |
In-situ Geometric Characterization via Embedded 3D Scanning and Implicit Modeling |
| Author(s) |
Tadeusz Kosmal, Samuel Pratt, Christopher Williams |
| On-Site Speaker (Planned) |
Tadeusz Kosmal |
| Abstract Scope |
Additive Manufacturing’s (AM) layer-wise construction is susceptible to intrinsic process variation and fabrication errors. In-situ monitoring techniques have been proposed to detect errors, but limit inspection to a localized deposition or final part state, failing to capture how formed layers change throughout processing. Embedded 3D scanning can address these limitations, yet conducting layer-wise evaluation of high-resolution scans presents significant data management and optical challenges for compatibility with a production environment. We present a novel methodology to rapidly capture and characterize error using a digitally integrated Structured Light Scanning (SLS) system and Signed Distance Function (SDF) approach. Using this approach, in-situ deviation of printed structures can be analyzed within seconds over relatively large areas (250 cm2) at a high spatial resolution (0.3mm). The proposed method is process agnostic and is validated in a layer-by-layer analysis of hybrid Wire-Arc AM processing. |
| Proceedings Inclusion? |
Definite: Post-meeting proceedings |