| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
3D Maps of Geometrically Necessary Dislocation Densities in FCC Polycrystalline IN718 |
| Author(s) |
Wyatt A. Witzen, Andrew T Polonsky, Tresa M Pollock, Irene J Beyerlein |
| On-Site Speaker (Planned) |
Wyatt A. Witzen |
| Abstract Scope |
Three dimensional Electron Backscatter Diffraction (3D EBSD) as a method of orientation analysis offers the ability to characterize material microstructure in 3D space, allowing the calculation of Geometrically Necessary Dislocation (GND) densities. Feature reference misorientation within each grain imaged in this dataset reveals that some grains exceed 20 degrees in misorientation to the overall orientation of the grain, leading to the partitioning of subgrains and other areas of high misorientation within single grains. This orientation imaging technique allows GND density mapping in 3D space and provides insight to these subgrain features, particularly useful for additively manufactured material characterization. In this study, GND densities ranging from roughly 1 × 10<sup>11</sup> to 1.8 × 10<sup>13</sup> m<sup>-2</sup> have been calculated from the high degree of misorientation within these grains. Additionally, GNDs are calculated using different nearest-neighbor environments to understand how disorientation measured over different neighborhood configurations will influence the GND densities calculated. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |