| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Phase Stability, Phase Transformations, and Reactive Phase Formation in Electronic Materials XXIV
|
| Presentation Title |
Advanced Characterization and Analysis for Improved Stable Material Structures |
| Author(s) |
Roland Brunner |
| On-Site Speaker (Planned) |
Roland Brunner |
| Abstract Scope |
Phase stability in microelectronic materials is highly linked to defect formation and possible device break-down. Here, in this talk we review our recent results. We show, how the utilization of ML-supported experimental characterization and analysis combined with modeling methods helps to provide an enhanced understanding. Nanocrystalline thin films show highly attractive material properties, such as high hardness, strength and wear resistance. However, a big drawback concerns the emerging large residual stresses that result from their fabrication by deposition. One solution, is to stabilize the nanocrystalline structure by alloying with a minority element. example concerns Sn – 3.0 wt.% Ag – 0.5 wt.% Cu (SAC305) solder alloys. The predominant fatigue mechanism in SAC305 solders is intergranular fatigue cracking. One approach to enhancing fatigue strength in SAC305 is adding Bi to the alloy, which acts as a solid solution strengthener, increasing its yield strength and hence delaying recrystallisation and subsequent intergranular cracking. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Machine Learning, Characterization, Electronic Materials |