About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
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Symposium
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AI/Data Informatics: Computational Model Development, Verification, Validation, and Uncertainty Quantification
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Presentation Title |
Data-Driven Modeling of Performance Degradation in Optoelectronic and Electronic Materials in a High Performance Computing Environment |
Author(s) |
Jarod Allen Kaltenbaugh, Max Liggett, Taylor Currie, Matt Hoffman, Ayorinde Emmanuel Olatunde, Pawan Tripathi, Dylan Colvin, Mengjie Li, Alp Sehirlioglu, Roger H French, Kristopher H Davis |
On-Site Speaker (Planned) |
Jarod Allen Kaltenbaugh |
Abstract Scope |
The performance degradation of optoelectronic and electronic materials can be analyzed based on current-voltage (I-V) and capacitance-voltage (C-V) measurements. These measurements result in large amounts of data using a process that can vary across different research groups. Extracting performance parameters can be a time consuming process that prevents large scale analysis of I-V and C-V data. Therefore, it is necessary to create a process that can rapidly standardize and analyze large sets of data. This work uses data-driven models that have been trained on FAIR data and can be used on a high performance computing environment (HPC). The HPC and data-driven models can be used to rapidly analyze I-V and C-V measurements performed on photovoltaic (PV) modules and interdigitated combs (IDCs) before, during, and after certain exposures and environmental stressors have been applied. Performance degradation's specific root causes can then be directly linked to the exposures and environmental stressors. |
Proceedings Inclusion? |
Planned: |
Keywords |
Electronic Materials, Computational Materials Science & Engineering, |