| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Materials through High Resolution Coherent Imaging
|
| Presentation Title |
Simultaneous Reciprocal and Real Space X-Ray Imaging for Hierarchical Characterization of 3D Nano-Architected Metamaterials |
| Author(s) |
Matias Kagias, Seola Lee, Dula Parkinson, Nicholas W. Phillips, Julia R. Greer |
| On-Site Speaker (Planned) |
Matias Kagias |
| Abstract Scope |
The advent of 3D nanofabrication methods has given rise to a new class of materials termed nano-architected metamaterials. With their tailored 3D architecture these materials achieve unique macroscopic properties, ranging from extreme mechanical resilience to negative refractive indices. With the recent introduction of scalable 3D nanofabrication reaching sample sizes in the centimeter scale, characterizing nano-architected metamaterials poses a challenging hierarchical characterization problem. Here we present recent progress in characterizing the sub-micrometer structure of lithographically produced 3D nano-architected polymer based sheets with approximately 500 nm features and 30 micrometer thickness by combining reciprocal space and full field imaging at synchrotron sources. We utilize a two dimensional array of 3234 zone plates that allows to locally sense reciprocal information during full field imaging operation. Our experimental results demonstrate the high sensitivity of the approach for probing structural uniformity that is linked to the local elastic modulus of the imaged materials. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Mechanical Properties, Polymers |