About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
|
Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
Presentation Title |
Simulated STEM-DCI Imaging of Dislocations in High-entropy Alloys |
Author(s) |
Joseph Tessmer, Mulaine Shih, Marc De Graef |
On-Site Speaker (Planned) |
Joseph Tessmer |
Abstract Scope |
Experimental Scanning Transmission Electron Microscope-Defect Contrast Imaging (STEM-DCI) of dislocations in High-Entropy Alloys (HEAs) has shown that dissociated dislocations can display a strong variance in dissociation distance. Preliminary work with Molecular Dynamics (MD) simulations has shown that this variance could be due to the solid-solution nature of HEAs leading to local changes in the stacking fault energy. These simulated results can be interpreted in multiple ways, such as Nye tensor analysis, but direct comparison with experimental STEM-DCI images can be challenging. Simulation STEM-DCI images from the MD simulation output data provides the opportunity for a one-to-one comparison between experiment and simulation, providing further insight on the mechanisms of defect behavior in these (and potentially other) material systems. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |