| About this Abstract |
| Meeting |
2023 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Integration of X-Ray Microscopy and Finite Elements into a Digital Twin |
| Author(s) |
Mustafa Elsherkisi, Theo Huyghe, Maadhav Kothari, Fabian Duarte Martinez, Simon Gray, Gustavo Castelluccio |
| On-Site Speaker (Planned) |
Mustafa Elsherkisi |
| Abstract Scope |
X-Ray microscopy (XRM) has revolutionised materials characterisation with impressive details and resolution. However, materials responses depend on myriads of attributes that cannot be entirely characterised by a single device. Thus, computational modelling can complement experimental efforts by providing estimations of attributes (e.g., stress) concurrent with the material characterisation.
This presentation will focus on the integration of XRM with finite element models (FEM) to enable mapping of real-life cracks that are translated to realistic model meshes. We will demonstrate that the approach has been instrumental to uni-vocally discover the damage mechanism involved in stress corrosion cracking. We will further present an autonomous integration approach between XRM and FEM that can be implemented concurrently with the material characterisation. The seamless XRM-FEM exchange has the potential to control experiments based on magnitudes that are not measured but modelled. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Modeling and Simulation, Mechanical Properties |