| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Mechanical Behavior at the Nanoscale V
|
| Presentation Title |
Exploring the Extremes of Mechanical Behavior Through In-situ Electron Microscopy |
| Author(s) |
Khalid Hattar, Christopher M. Barr, Gowtham S. Jawaharram, Nathan Heckman, Brad L. Boyce, Shen J. Dillon |
| On-Site Speaker (Planned) |
Khalid Hattar |
| Abstract Scope |
To understand new or complex interactions of mechanisms active in extreme environments, one must be able to directly observe the materials response with adequate resolution. Sandia has developed a set of SEM- and TEM-based tools to explore mechanical behavior during a wide range of extreme conditions. This presentation will include snapshots of results during in-situ SEM and TEM fatigue, ex-situ radiation-fatigue, in-situ TEM creep above 2000 °C, as well as in-situ TEM irradiation induced creep at both room and elevated temperatures. The overlap of mechanical testing with laser and ion beam irradiation permits a wealth of complex operational environments that can be explored with nanometer resolution. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525 |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |