| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Microscratch-induced Deformation Twins in Mg Single Crystals |
| Author(s) |
Kehang Yu, Xin Wang, Olivia Donaldson, Subhash Mahajan, Irene J. Beyerlein, Timothy J. Rupert, Julie M. Schoenung, Enrique J. Lavernia |
| On-Site Speaker (Planned) |
Kehang Yu |
| Abstract Scope |
Microscratching was developed and implemented as a technique to induce a localized stress field in order to study the behavior of twins in Mg; surprisingly, there are very few published studies using this approach. In this work, the microscratch was performed on a Mg single crystal using different scratch parameters. The microscratched Mg was then characterized with serial sectioning and EBSD to show the twin distribution in a 3D manner. The twin distribution was also predicted based on microscratch-induced stress field calculations using an analytical solution and finite element method (FEM). An experiment-calculation comparison examined the correlation between the local stress field and twin formation. Our results suggest that, by controlling the loading conditions, microscratching is able to generate deformation twins with predicted variant and morphology. Furthermore, forming twin networks or meshes could be made possible with multiple microscratches for the study of twin-twin interactions in Mg. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |