| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Printed Electronics and Additive Manufacturing: Advanced Functional Materials, Processing Concepts, and Emerging Applications
|
| Presentation Title |
Thermal conductivity measurement of a thin layer of the single crystals of PMN-PT using time Domain thermoreflectance (TDTR) technique |
| Author(s) |
Sagar Kumar Verma, Sieun Chae, Nirmala Kandadai |
| On-Site Speaker (Planned) |
Sagar Kumar Verma |
| Abstract Scope |
Recent advances in thin film single crystal, piezoelectric materials, such as Pb(Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT), Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 (PIN-PMN-PT), and Pb(ZrxTi1-x)OO3 (PZT) have a large potential to create technological advancements in various fields of transducers, sensors, actuators, and energy storage due to their giant piezoelectric coefficient. However, the thermal properties of thin film single crystal structures vary significantly from bulk and are dependent on various parameters such as growth technique, substrate orientation, etc. In this work, through plane thermal properties of the single crystals of PMN-PT thin film grown on SrTiO3 (STO) (100) substrate using molecular beam epitaxy (MBE) were investigated using a pump and probe technique called time domain thermoreflectance (TDTR). The estimated values of the through-plane thermal conductivity and volumetric heat capacity of the single crystals of PMN-PT are 1.37 Wm−1K−1 and 1.10×106Jm−3K−1 respectively. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Additive Manufacturing, Energy Conversion and Storage, Electronic Materials |