| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
|
| Presentation Title |
Applications of 3D EBSD for Understanding Complex Microstructures |
| Author(s) |
Andrew Polonsky, Julia Deitz, Hojun Lim, Michael Melia, Kyle Johnson, Peter Renner, Kasandra Herrera, Luis Jauregui, Damion Cummings |
| On-Site Speaker (Planned) |
Andrew Polonsky |
| Abstract Scope |
The advancement of automation over the last decade has led to various novel techniques for materials characterization. The ability to serially-section samples within a Scanning Electron Microscope (SEM) using ion- or laser-beams has enabled the collection of three-dimensional (3D) electron backscatter diffraction (EBSD) data at high-fidelity and at ever-increasing data volumes. In this work, we present applications of 3D EBSD for interrogation of complex microstructures collected via serial sectioning using the TriBeam system, providing unique insights to these materials that are unattainable via conventional characterization methods. Considerations of analysis for non-equilibrium microstructures, such as those generated via macroscopic plastic deformation or from additively manufactured parts, will be discussed. Workflows for automated handling of large multi-terabyte datasets will also be presented, as well as the utilization of these data for advanced modeling approaches to deepen fundamental understanding of materials processing. |
| Proceedings Inclusion? |
Planned: |