About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
|
Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
Presentation Title |
Micron-scale Characterization of Twinning and Dislocation Slip in Magnesium Single-crystals by Advanced In-situ Techniques |
Author(s) |
Kristián Máthis, Dávid Ugi, Petr Harcuba, Michal Knapek, František Chmelík, Péter Dusán Ispánovity, István Groma |
On-Site Speaker (Planned) |
Kristián Máthis |
Abstract Scope |
A rare blend of combination of in-situ scanning electron microcopy (SEM) and acoustic emission (AE) technique has been employed for study the deformation behavior of Mg micropillars. The combination of these two techniques enables to study the underlying physical processes with exceptional spatiotemporal resolution. It is shown that the stress drops on the deformation curves caused by size-effect are in perfect correlation with the acoustic emission events. The internal dynamics of the twinning and dislocation slip is discussed in detail using statistical analysis of the data. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |