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Meeting 2025 TMS Annual Meeting & Exhibition
Symposium Novel Strategies for Rapid Acquisition and Processing of Large Datasets from Advanced Characterization Techniques
Presentation Title Advanced Computational and Data Management Approaches at the Advanced Photon Source
Author(s) Nicholas Schwarz
On-Site Speaker (Planned) Nicholas Schwarz
Abstract Scope The greatly enhanced brightness, coherence, and signal at high x-ray energies along with new state-of-the-art high-bandwidth commercial detectors at the renewed Advanced Photon Source (APS) necessitates significant improvements in networking, controls and data acquisition, automation, computing, workflow, data reduction and analysis tools, including AI/ML approaches, and data management to operate effectively. The APS has made great strides addressing these challenges. These strides include upgrades to networking infrastructure, deployment of state-of-the-art experiment control software at beamline instruments, expanded capabilities and use of common data management and workflow tools and science portals, utilization of new supercomputers for large on-demand data processing and analysis tasks, development of high-speed, highly parallel data processing and analysis software, and the application of novel mathematical and AI/ML methods to solve challenging data reduction and analysis problems. Additionally, the APS continues to collaborate with other light sources, experimental facilities, large-scale computing and networking facilities, and the user community.
Proceedings Inclusion? Planned:
Keywords Machine Learning, Computational Materials Science & Engineering,

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

A Retrieval-Augmented Generation Application in the Dental Composites Space
Accelerated Discovery of nanostructured High-Entropy Alloys With Superior Thermal Stability
Advanced Computational and Data Management Approaches at the Advanced Photon Source
AI-Driven Kikuchi Pattern Enhancement for Efficient and Robust EBSD Analysis of Highly Deformed Metals
AI-Driven Microstructural Data Correlation Using In-Situ Raman Spectroscopy in Self-Driving Lab by Using Chocolate As Frugal Twin
Application of the polyhedral template matching method for characterization of 2D atomic resolution electron microscopy images
Automated Real-Time 3D Stereo-Reconstructions Through Machine-Learning based Tracking
Challenges and Opportunities for Rapid EXAFS Analysis of Short-Range Order in HEAs
Characterization within an Automated Lab for Solid State Synthesis - Challenges and Solutions for Data Handling and Interpretation
Comparing Performance of U-Net Based Neural Networks for Automated Detection of Defects in TEM Images of Nuclear Materials
Correlative Microscopy and AI for Rapid Analysis of Complex Material Structures
Data Infrastructure - ‘The Missing Middle’
Deep Learning-Assisted Study of 3D Damage Evolution in Semiconductor Packages under Thermal Cycling Using X-ray Microcomputed Tomography
Deep Learning Conditional Diffusion models to recreate Scanning Electron Microscopy using Light Optical Microscopy Priors
Directing Flow: Pipelines for 3D Data
Efficient SEM Imaging Strategies for Microstructure Analysis in Metal Additive Manufacturing
Enhanced quantification of reinforcement particles in additively manufactured IN718 using microfocus X-ray computed tomography and CGAL Alpha Wrapping tool
From chaos to clarity: Managing the materials data surge
High-Throughput Quantitative Texture Imaging Using Wide-Field Laser Polarized-Light Microscope
High-throughput synthesis and rapid characterization of Cu-Ti alloys
High-Throughput Uniaxial Tensile/Compressive Testing in Additive Manufacturing Using Reference Material Load Cell Method
High throughput characterization of 316L stainless steel fabricated using laser powder bed fusion
Interrogating 3D Grain Morphology and Crystallographic Texture via Automated Polarized Light Microscopy
Optimization of Automated Sample Polishing Enabled by the Characterization of Surface Roughness Evolution
Optimizing Nanoindentation Methods for the High Throughput Study of Combinatorial Thin Film Libraries
Overview of Machine Learning in Low-Latency Automated Data Analysis for In-Situ Synchrotron X-ray Diffraction in Metals and Alloys
Rapid data-driven non-destructive inspection of additively manufactured IN718 using the side-band peak counting (SPC) non-linear ultrasonics method
Rapid synthesis, characterization and mechanical testing of novel printable alloys via functional grading in additive manufacturing
Real time Pole figures from polycrystalline samples during far field HEDM
Strategies for accelerated collection, and data curation of multi-modal serial-sectioning experiments.
Three-dimensional Laue-diffraction microscopy with a coded aperture: principles and high-performance-computing workflow
Towards Accelerated Material Characterization: Uncertainty Quantification in Elemental Analysis
“Microstructure Informatics”: Automated microstructure characterization and neural network based modeling of processing-structure-property relations.

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