| Abstract Scope |
Multi-layered ceramic capacitors (MLCCs) have been used for various electric devices, along with rapid development of the devices. Lifetime under high-temperature and dc voltage operation is one of the important characteristics of the MLCCs, consisting of BaTiO3 based dielectric materials and internal Ni electrode. Yang et.al. have studied on deterioration mechanism on insulation resistance by oxygen vacancy of the dielectric materials, under highly accelerated life tests (HALTs) [1]. Recently, we have reported a method to degrade MLCCs just before dielectric breakdown in HALTs, enabling different levels of degradation [2]. Careful analyses of these ‘pre-breakdown’ samples may lead us to understand procedures from start of resistance degradation to the final dielectric breakdown. The purpose of this research is to visualize how resistance degradation develops on the dielectric materials, by looking at the ‘pre-breakdown’ samples.
This presentation will describe the use of scanning spreading resistance microscopy (SSRM) measurement to map the levels of conductivity on laminated cross sections of the ‘pre-breakdown’ MLCCs.
References
[1] G. Y. Yang, G. D. Lian, E. C. Dicky, C. A. Randall, J. Appl. Phys., 96, 7500 (2004).
[2] T. Sada, N. Fujikawa, Jpn. J. Appl. Phys., 56, 10PB04 (2017). |