| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2024: Process-Structure-Property Relations and New Technologies
|
| Presentation Title |
Correlative Micro-nano X-ray Tomography with Scanning Electron Microscopy at the Advanced Light Source |
| Author(s) |
Arun Bhattacharjee, Harrison Lisabeth |
| On-Site Speaker (Planned) |
Arun Bhattacharjee |
| Abstract Scope |
Characterization of geological samples at multiple scales is critical in understanding and correlating the physical and chemical processes taking place at micro and nano scales. Correlative micro and nano x-ray tomography was performed on three mineral systems followed by SEM analysis. The correlative study was performed in 5 steps: i) Micro x-ray tomography was performed on mineral sample cores, (ii) sample for nano tomography was prepared using laser milling, (iii) nano tomography was performed on the prepared sample, (iv) sample was mounted and polished for SEM analysis and (v) SEM imaging and compositional mapping was performed on micro and nano tomography samples for complimentary information. Significant differences in the volume fraction of pores and mineral phases were also observed indicating the necessity of such multi-scale approach for the characterization of minerals. Adoption of the protocol would be helpful in 3D imaging studies being performed at the advanced light source. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Other |