Conference Tools for 2025 TMS Annual Meeting & Exhibition

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About this Abstract
Meeting	2025 TMS Annual Meeting & Exhibition
Symposium	Characterization of Materials through High Resolution Coherent Imaging
Presentation Title	ML-Guided Non-Destructive 3D Metrology of Functioning Devices With an X-Ray Laser
Author(s)	Oliver Hoidn, Aashwin Mishra, Matthew Seaberg, Apurva Mehta
On-Site Speaker (Planned)	Apurva Mehta
Abstract Scope	Watching the smallest cogs move in a complex machine shows how it functions and why it fails. The cogs driving many critical technologies, from microelectronics to batteries, are shrinking to a few nanometers. Nanoscale structures, e.g., crack tips, also control the functioning of larger components. We must see these cogs in operating devices with nanometer resolution but a field of view (FOV) of microns to see how they mesh with other cogs. Optical probes don’t have the resolution. Electron probes don’t have the needed FOV and are often destructive. X-rays have resolution and sufficient penetration to view large 3D volumes noninvasively. However, poor quality of X-ray optics limits resolutions. Coherent lensless imaging gains resolution but at the expense of reconstruction speed. I will discuss Physics-Informed Machine Learning approaches that speed up reconstruction by 1000 times and, by extracting information buried in noise, can accelerate data collection by another ten times.
Proceedings Inclusion?	Planned:
Keywords	Machine Learning, Mechanical Properties, Energy Conversion and Storage

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

AI-Driven Workflow for Autonomous High-Resolution Scanning X-Ray Microscopy

Bragg Coherent Diffractive Imaging With Twisted X-Rays

Characterization of Crystalline Materials at the Atomic Scale with X-Ray Bragg Coherent Diffraction Imaging

Coherent x-Ray Diffraction Imaging Dedicated Beamlines at PLS-II and Korea-4GSR

Direct Reciprocal Space Detection of Microelectronic Defects Using Coherent X-Ray Diffraction and Unsupervised Machine Learning

Enhanced Mineral Characterization With 3D X-Ray CT and AI-Driven Imaging

Explanation of the High-Dielectric Constant of BaTiO3 Used in Multilayer Capacitors

High-Resolution X-Ray Imaging of Integrated Circuits

High Bandwidth Scanning X-Ray Microscopy

In-Situ/Operando Bragg Coherent X-Ray Diffraction Imaging for Catalysis Studies

ML-Guided Non-Destructive 3D Metrology of Functioning Devices With an X-Ray Laser

Nanoholotomography With Coded Apertures for Efficient Dynamic Imaging of Nanomaterials

Operando and Linear Dichroic Ptychographic Spectro-Tomography of Heterogenous Catalysts

Origin of Structural Degradation in Layered Oxide Cathode for Li-Ion Batteries

Physics-Informed Self-Supervised Learning of Structural Morphology Imaged by Scanning X-Ray Diffraction Microscopy

Probing Cryogenic Strain Evolution in SrTiO3 Using Multi-Reflection Bragg Coherent Diffraction Imaging

Rapid Reconstruction of the Full Strain Tensor via Coupled Phase Retrieval With Multipeak Bragg Coherent Diffraction Imaging

Real-Time Imaging of Subsurface Dislocation Dynamics

Simultaneous Reciprocal and Real Space X-Ray Imaging for Hierarchical Characterization of 3D Nano-Architected Metamaterials

Single-Exposure Elemental Differentiation and Texture-Sensitive Phase-Retrieval Imaging with a Neutron-Counting Microchannel-Plate Detector

Single-Shot X-Ray Imaging of Density in Laser Shocked Materials for Fusion Energy Studies

Synchrotron Ptychographic X-Ray Computed Tomography (PXCT) to Study Micro-Fabricated Fully Hybrid 3D Metal-Ceramic Metamaterials

Three-Dimensional Hard X-Ray Ptychographic Reflectometry Imaging on Extended Mesoscopic Surface Structures

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