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| Conference Tools for 2020 TMS Annual Meeting & Exhibition |
About this Abstract |
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| Meeting | 2020 TMS Annual Meeting & Exhibition |
| Symposium | Advanced Characterization Techniques for Quantifying and Modeling Deformation |
| Presentation Title | Microstructure Evolution During Dynamic Compression in Titanium Characterized with the XFEL at LCLS-2 |
| Author(s) | Sven C. Vogel, Cindy A. Bolme, Donald W. Brown, Ellen Cerreta, Joseph T. Mang, Benjamin M. Morrow, Kyle J. Ramos, Igor Usov, Suzanne Ali, Damian Swift, Eric Galtier, Arianna Gleason, Eduardo Granados, Amy Lazicki, Philip Heimann, Despina Milathianaki, Bob Nagler, Luca Lutterotti |
| On-Site Speaker (Planned) | Sven C. Vogel |
| Abstract Scope | Transient time of a shock wave traveling at a few thousand meters per second through ten micrometers of material is a few nanoseconds. Post mortem analysis provides only limited insight into the microstructural evolution during such a shock. The advent of XFELs as intense, short pulse X-ray sources for diffraction characterization in conjunction with high-powered optical lasers to induce shocks into materials have enabled in situ characterization during dynamic compression of single crystal or polycrystalline materials. In this presentation we report the first successful application of Rietveld analysis to obtain strains, volume fractions, and textures of the phases occurring during shock of pure titanium metal, thus providing for the first time a complete picture of the microstructure evolution during shock. A sequence of fresh samples characterized in this way with a 0.5 ns temporal resolution allowed to study for the first time the microstructural evolution in titanium during shock. |
| Proceedings Inclusion? | Planned: Supplemental Proceedings volume |
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