About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
In-Situ TKD Nano-tensile Testing: Unveiling Nanoscale Crystal Plasticity, TWIP, and TRIP |
Author(s) |
Tijmen Vermeij, Amit Sharma, Johann Michler, Xavier Maeder |
On-Site Speaker (Planned) |
Tijmen Vermeij |
Abstract Scope |
We propose a novel in-situ Transmission Kikuchi Diffraction (TKD) nano-tensile testing methodology, offering an attractive compromise between the ultra-high resolution of in-situ TEM and the scalability and accessibility of in-situ EBSD testing. We combine (i) dedicated FIB processing for site-specific specimen liftout and preparation, (ii) a push-to-pull device for application of in-situ tension, and (iii) an SEM configured for in-situ TKD and transmission SEM with an Alemnis in-situ nanoindenter. As proof of concept, we tested complex CuAl nanolaminates with nm-thickness amorphous Al2O3 interlayers and selected single crystal specimens. In the CuAl/Al2O3 nanolaminates, we observe the development of twinning, dislocation plasticity and grain boundary interactions. Furthermore, our method effectively tracks the initiation and evolution of advanced nanoscale deformation mechanics, such as TWIP and TRIP, on well-defined specimens. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Phase Transformations, Thin Films and Interfaces |