| About this Abstract |
| Meeting |
2021 TMS Annual Meeting & Exhibition
|
| Symposium
|
Frontiers in Solidification Science VIII
|
| Presentation Title |
Combination of X-ray Topography and Radiography for In Situ and Time Resolved Investigation of the Solidification of Silicon |
| Author(s) |
Hadjer Ouaddah, Gabrielle Regula, Guillaume Reinhart, Nathalie Mangelinck-Noel |
| On-Site Speaker (Planned) |
Nathalie Mangelinck-Noel |
| Abstract Scope |
Aiming to the production of low cost and high efficiency solar cells based on silicon material, all processes either innovative or conventional face challenges linked to the grain structure and crystalline defects left during the solidification step.
Our contribution consists in conducting in situ and time-resolved investigations on the fundamental solidification mechanisms in a unique device named GaTSBI (Growth at high Temperature observed by X-ray Synchrotron Beam Imaging). Two imaging techniques using X-ray synchrotron radiation are combined during solidification: X-ray radiography and Bragg diffraction (topography). X-ray radiography brings information on the morphology and kinetics of the solid/liquid (S/L) interface. X-ray Bragg diffraction gives complementary information about misorientations, structural defect formation and the local level of deformation of the crystal structure.
During the presentation, the dynamics of twinning, grain competition and the origin of dislocations as well as their interaction with grain boundaries during solidification will be presented. |
| Proceedings Inclusion? |
Planned: |