| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2025: In-Situ Characterization Techniques
|
| Presentation Title |
Correlative Transmission Electron Microscopy For
In Situ Grain Growth Studies in Metallic Thin Films |
| Author(s) |
Matthew Patrick, Jeffrey Rickman, Katayun Barmak |
| On-Site Speaker (Planned) |
Matthew Patrick |
| Abstract Scope |
Grain structure is a principal factor in determining the properties of materials, but many open questions remain regarding the dynamics of microstructural evolution. Here, we demonstrate an experimental approach which allows for complete in situ characterization of thin film microstructure in the scanning/transmission electron microscope (S/TEM) during evolution. Leveraging thin films’ unique columnar microstructures, computer vision driven drift correction, and in-situ heating equipment, grain growth is directly observed using parallel-beam TEM techniques, at time resolutions of ~1 fps. These images are analyzed using a recent machine learning model to identify grain boundaries to dynamically track evolution. Orientation maps are intermittently collected in the same region, providing crystallographic information including the 5-parameter grain boundary character of each segment and development of film orientation texture. Used in conjunction, these data allow experimental access to a range of dynamic features relevant to coarsening with time resolutions not available using other techniques. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Thin Films and Interfaces, Machine Learning |