| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Influence of Grain Boundary Mediated Deformation on the Ductility of Freestanding Metallic Thin Films |
| Author(s) |
Benoit Merle |
| On-Site Speaker (Planned) |
Benoit Merle |
| Abstract Scope |
New insights into the mechanisms accommodating large plastic deformations in freestanding metallic films are provided by in situ mechanical testing on 30-200 nm thick PVD gold, copper, and silver films in a Transmission Electron Microscope (TEM) and an Atomic Force Microscope (AFM).
From in-situ tensile testing in the TEM, it was found that grain boundary mediated deformation mechanisms significantly increase the tolerance of the samples to small cracks and leads to a ductility well above 10% plastic strain, which can be rationalized by the high strain-rate sensitivity of the films. However, larger samples typically fail around 1% strain, presumably as a result of larger defects introduced during fabrication. Using the bulge test technique inside an AFM, it was found that introducing grain boundaries and increasing the material strength is key to maximizing the fracture toughness and therefore extending the ductility of such large freestanding specimens. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |