About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
|
Symposium
|
Advanced Materials for Energy Conversion and Storage 2025
|
Presentation Title |
Enhancing the Thickness Uniformity of Electroplated Cobalt Thin Films on SOFC Interconnectors through Electrochemical and Microstructural Control |
Author(s) |
Ki-Young Lee, Hyun Park, Hyo-Jong Lee, Jung Han Kim |
On-Site Speaker (Planned) |
Ki-Young Lee |
Abstract Scope |
Solid oxide fuel cells (SOFCs), known for their efficiency and environmental benefits, utilize interconnectors made primarily of ferritic stainless steel with chromium content. However, these materials suffer from chromium sublimation issues during high-temperature operation, impacting durability. To address this challenge, research focuses on applying a thin cobalt (Co) passivation layer. In this study, we explored methods to improve the uniformity of electroplated Co thin films on SOFC interconnectors. By carefully controlling electrochemical parameters and microstructural characteristics, we aimed to optimize the deposition process. Electron Backscatter Diffraction (EBSD) analysis provided insight into particle size and orientation, which are important factors affecting film properties and performance. Our findings highlight the importance of precise control over electrochemical conditions and microstructural characteristics in achieving uniform Co thin films on SOFC interconnectors. This research contributes to the development of effective passivation strategies, enhancing the durability and performance of SOFCs as sustainable energy solutions. |
Proceedings Inclusion? |
Planned: |
Keywords |
Energy Conversion and Storage, Surface Modification and Coatings, Thin Films and Interfaces |