| About this Abstract |
| Meeting |
MS&T23: Materials Science & Technology
|
| Symposium
|
Advances in Dielectric Materials and Electronic Devices
|
| Presentation Title |
Investigation of the Effects of the Most Common Impurities of Bayer Alumina on the Dielectric Properties |
| Author(s) |
Alexander Schuster, Antje Liersch |
| On-Site Speaker (Planned) |
Alexander Schuster |
| Abstract Scope |
The phenomenon of Dielectric Breakdown Strength (DBS) is defined as immediate and irreparable failure. Irreparable material failure of oxide ceramic insulators occurs when the voltage across the insulator is too high. This can also lead to thermally induced structural failure. While influencing factors such as voltage ramp, electrode shape and overall porosity have been the subject of some studies, the effect of impurity oxides on the dielectric properties has mainly been investigated on high purity alumina. However, impurities such as Na2O and Fe2O3 are one of the major impurities in Bayer alumina and can have a number of other effects on the dielectric resistance. Both are capable of significantly altering material properties such as sintering behaviour, pore number and morphology, as well as modifying permittivity. FESEM and Rahman measurements have shown their influence on the microstructure and dielectric properties of Bayer alumina. |