| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2025: In-Situ Characterization Techniques
|
| Presentation Title |
Enabling Advances in Electron Backscatter Diffraction With Direct Electron Detectors (DED) |
| Author(s) |
Tianbi Zhang, Thomas Benjamin Britton |
| On-Site Speaker (Planned) |
Thomas Benjamin Britton |
| Abstract Scope |
Electron backscatter diffraction (EBSD) is a commonly used materials characterization technique that can be applied to understand microstructures, with quantitative mapping of the crystal phase and orientation in the scanning electron microscope. In this work, we explore the use of small form factor hybrid pixel direct electron detectors (e.g. Timepix3) to open up new geometries and analysis approaches. Amongst our developments, we will showcase the use of our detector to create a low-cost 'static' EBSD geometry that can be used in almost any scanning electron microscope, as well as a constrained transmission Kikuchi diffraction (TKD) geometry to provide STEM-in-SEM crystallographic characterization with a wide capture angle of the unit cell (>±55° from the direct beam). Our case studies in metallic and semiconductor samples will highlight opportunities to explore and understand materials and provide new insight. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, |