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Meeting	2021 TMS Annual Meeting & Exhibition
Symposium	Characterization of Materials through High Resolution Imaging
Presentation Title	Mesoscale Defect Dynamics in the Bulk with Time-resolved Dark-field X-ray Microscopy
Author(s)	Leora E. Dresselhaus-Marais
On-Site Speaker (Planned)	Leora E. Dresselhaus-Marais
Abstract Scope	Materials respond to their surroundings based on their native properties and how their defects interact. Mesoscale defect interactions connect atomic imperfections to the continuum properties. Experimental tools in this regime struggle to time-resolve measurements of defects buried deep beneath the surface. Dark-field X-ray microscopy (DFXM) can now directly image defects in single- and poly-crystals, resolving distortions deep beneath the surface over a wide field of view, with high sensitivity to strain and inclination in the lattice. We have extended DFXM to time-resolved studies at synchrotron and X-ray free electron laser facilities to collect movies of mesoscale deformation processes in-situ. With these early studies, I will show how time-resolved DFXM now presents opportunities to study mesoscale dynamics to inform multi-scale models. This work was performed in part under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344.
Proceedings Inclusion?	Planned:

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