| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Mechanical Response of Materials Investigated through Novel In-situ Experiments and Modeling
|
| Presentation Title |
A Novel X-ray Diffraction Simulation Framework for Rapid Thermo-mechanical Processes |
| Author(s) |
Darren C. Pagan, Thien Q Phan, Joel V Bernier |
| On-Site Speaker (Planned) |
Darren C. Pagan |
| Abstract Scope |
The past few years have seen significant advances in the ability to perform X-ray diffraction experiments at extremely short times scales (microseconds) to study rapid thermo-mechanical processes and develop new constitutive models. However, the wide energy bandwidth optics utilized and thermo-mechanical gradients present across the probe volume often make quantitative analysis of the measurements difficult. To help aid these analyses, we present a new polychromatic diffraction-based simulation framework for analysis of area detector diffraction data gathered during thermo-mechanical processing of crystalline materials. Results generated using the framework will focus on deconvolution of spatial thermal gradients during rapid heating and cooling (i.e., during the additive manufacturing process). |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |