| Abstract Scope |
Ongoing miniaturization in devices and the progress in surface science demand novel methods for surface characterization, on a scale of few atomic distances. Combination of a low-energy electron microscope (LEEM) and an x-ray photoelectron emission microscope (XPEEM) is a powerful technique for studying the dynamic and static properties of 2D materials and thin films, including growth and decay, phase transitions, reactions, surface structure and morphology. It utilizes low energy electrons to image surfaces with few nm lateral resolution and atomic layer depth resolution. In the LEEM/XPEEM setup, when using the electron irradiation, the backscattered electrons, Auger and secondary electrons may be used, while photoelectrons, Auger and secondary electrons are utilized for imaging while the sample is irradiated with x-ray photons. In this talk I will present examples of the application of the LEEM/XPEEM technique to the investigations of novel materials including thin films, 2D layered materials, and adsorbate structures. |