About this Abstract |
Meeting |
TMS Specialty Congress 2025
|
Symposium
|
The 7th International Congress on 3D Materials Science (3DMS 2025)
|
Presentation Title |
Diffraction Microstructure Imaging at the Materials Science Beamline, ID11, at the ESRF |
Author(s) |
Jon Wright, Haixing Fang, Wolfgang Ludwig, James Ball |
On-Site Speaker (Planned) |
Jon Wright |
Abstract Scope |
Synchrotron instrumentation has not stopped improving. New sources are coming online so that the X-ray flux and beam properties are better than ever before. Fast photon counting detectors are widely available and these offer a range of novel diffraction-tomographic methods for imaging microstructures in 3D. At beamline ID11 at the ESRF, there is now a suite of complementary methods that combines imaging detectors for tomographic imaging and DCT grain mapping together with far-field detectors for 3DXRD and scanning tomography. We have optimized the instrument at ID11 for beam sizes down to about 150 nm and high-energy X-rays (40-70 keV). The largest samples are typically a few millimeters in diameter. This contribution will discuss the latest developments at the beamline and the different ways that these are being exploited to address a range of different scientific questions, in a wide range of disciplines, from metallurgy to earth sciences. |
Proceedings Inclusion? |
Undecided |