| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
4D Integrated X-ray Imaging and Modeling of Nanoscale Dynamics |
| Author(s) |
Mathew J. Cherukara, Kiran Sasikumar, Subramanian Sankaranarayanan, Ross Harder |
| On-Site Speaker (Planned) |
Mathew J. Cherukara |
| Abstract Scope |
Observing the dynamic behavior of materials can reveal insights into the response of materials under non-equilibrium conditions of pressure, temperature and mechanical load. Such insights into materials response under non-equilibrium is essential to design novel materials for catalysis, low-dimensional heat management, piezoelectrics, and other energy applications. However, material response under such conditions is challenging to characterize especially at the nano to mesoscopic spatiotemporal scales. Time-resolved coherent diffraction imaging (CDI) is a unique technique that enables three-dimensional imaging of lattice structure and strain dynamically. In this talk I will present some examples of our recent work on imaging and modeling of phonon transport and lattice dynamics in nanomaterials under a variety of external stimuli. I will highlight the use of experimentally informed models that leverage large-scale computational resources. These experimentally informed models were used to provide information complementary to the imaging experiment, and at spatio-temporal scales inaccessible to the experiment. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |