About this Abstract |
Meeting |
TMS Specialty Congress 2024
|
Symposium
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2nd World Congress on Artificial Intelligence in Materials & Manufacturing (AIM 2024)
|
Presentation Title |
Classification of 2D Diffractograms Into “Spotty” and “Continuous” Patterns Using Deep Neural Networks Trained By ab-Initio Simulations |
Author(s) |
Mohommad Redad Mehdi, Weiqi Yue, Pawan K. Tripathi, Matthew A. Willard, Roger H. French, Frank Ernst |
On-Site Speaker (Planned) |
Pawan K. Tripathi |
Abstract Scope |
The advances in current and next-generation synchrotrons for X-ray diffractometry has opened up a world of challenging data analysis opportunities. The short X-ray wavelength that can be achieved in synchrotrons can provide information about the atomistic structure and microstructure of the material to greater penetration depths and with higher spatial and temporal resolution. Since most of the detectors used in synchrotrons are area detectors, thus diffractograms and video sequences (movies) are 2D, we can use the tremendous power of deep neural networks (DNN) to extract detailed structural information from these diffractograms.
We present a novel approach to classify sequences of diffractograms recorded during in-situ spatio-temporal investigations. Our approach uses deep learning, based on neural networks that are trained using ab-initio simulations of 2D diffractograms. These DNNs are capable of learning significant features from the simulated diffractograms, which allows them to classify the diffractograms as either “spotty” or “continuous.” |
Proceedings Inclusion? |
Definite: Other |