| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Hierarchical Microstructure in Shear Bands of Pure Titanium |
| Author(s) |
Xiaolong Ma, Dexin Zhao, Dinakar Sagapuram, Kelvin Yu Xuan Xie |
| On-Site Speaker (Planned) |
Kelvin Yu Xuan Xie |
| Abstract Scope |
A comprehensive understanding of shear band microstructure is the key to control the ductility of materials. However, large localized deformation usually develops within this thin region and nanoscale recrystallized grains are formed. Conventional characterization techniques such as EBSD and regular TEM imaging are inadequate to visualize the detailed microstructure inside these shear bands. For example, EBSD cannot provide high enough spatial resolution. TEM has the ability to determine the nanoscale grain size, but to elaborate the orientations of all grains is labor-intensive. Moreover, detailed orientation information cannot be obtained. In this work, we demonstrated that ASTAR (a technique that acquires the diffraction pattern of each pixel) could offer direct orientation information of microstructure feature down to 1 nm scale. Using the ASTAR results, we revealed the hierarchical structure including high-angle grain boundaries, low-angle grain boundaries, defect bundles in the shear bands. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |