About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
|
Symposium
|
AI/Data Informatics: Computational Model Development, Verification, Validation, and Uncertainty Quantification
|
Presentation Title |
Criteria for Statistical Equivalence of Predicted and Experimentally Observed Microstructures: Validation and Uncertainty Propagation |
Author(s) |
Arulmurugan Senthilnathan, Pranav Karve, Sankaran Mahadevan |
On-Site Speaker (Planned) |
Arulmurugan Senthilnathan |
Abstract Scope |
Process-to-structure (PS) models predict the microstructures that are utilized in structure-to-property (SP) micromechanical models to estimate the mechanical properties of the manufactured material. Existing PS models use experiments and physics laws to generate microstructures for the material and process of interest. We investigate metrics to measure statistical equivalence between the predicted microstructure generated from PS models and the true microstructure of the additively manufactured (AM) part. These metrics consider several descriptors of morphological, crystallographic features, and defects to quantify the statistical equivalence. Furthermore, the PS model uncertainties propagate from the microstructure to the macro-scale mechanical properties and performance. The PS model validation metrics are developed in a manner that also helps in propagating the PS model uncertainty to SP model. |
Proceedings Inclusion? |
Planned: |
Keywords |
ICME, Computational Materials Science & Engineering, Characterization |