About this Abstract |
Meeting |
TMS Specialty Congress 2024
|
Symposium
|
2nd World Congress on Artificial Intelligence in Materials & Manufacturing (AIM 2024)
|
Presentation Title |
Uncertainty Quantification in Machine-learning Models for Predicting β-phase Volume Fraction From Synchrotron X-ray Diffraction Patterns |
Author(s) |
Ayorinde Emmanuel Olatunde, Weiqi Yue, Pawan Tripathi, Roger H. French, Anirban Mondal |
On-Site Speaker (Planned) |
Ayorinde Emmanuel Olatunde |
Abstract Scope |
While many machine learning methods focus on deterministic and accurate prediction, we aim to quantify the uncertainties in these predictions. In particular, we focus on predicting the β-phase volume fraction, with its uncertainties, in a Ti–6Al–4V alloy during heat treatment from image sequences of 2D diffraction patterns recorded at a synchrotron beamline. In the first approach, we used Gaussian Process (GP) to model the relationship between optimal principal components of the 2D diffraction pattern and the β-phase volume fraction. A GP represents a distribution over a functional relationship by specifying a multivariate normal (Gaussian) distribution over all possible function values, from which, given a set of data points, we can make predictions on an unobserved data point and then carry out uncertainty analysis using predictive probability distribution. We quantitatively compared the GP results with an alternate procedure that used Convolution Neural Network and quantified its uncertainty by Monte Carlo ensemble. |
Proceedings Inclusion? |
Definite: Other |