| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Atomistic Simulations Linked to Experiments to Understand Mechanical Behavior: A MPMD Symposium in Honor of Professor Diana Farkas
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| Presentation Title |
Validating X-Ray Line-Profile Analysis of Defects in Deformed Metal Using Atomistic Simulation |
| Author(s) |
Chris Race, Tamas Ungar, Gabor Ribarik |
| On-Site Speaker (Planned) |
Chris Race |
| Abstract Scope |
The population of dislocation defects in a crystalline material strongly influences its properties, so the ability to analyse this population in experimental samples is of great utility. As a complement to direct counting in the transmission electron microscope, analysis of x-ray diffraction line profiles is an important tool. This is an indirect approach to quantification, which requires validation of the physical models that underlie the inferential process. Here we directly evaluate the ability of line profile analysis to quantify dislocations and stacking faults by exploiting atomistic models of deformed single crystals of fcc metal. We directly analyse these models to determine exact details of the defect content (our "ground truth"). We then generate theoretical line profiles for the models and analyse them using the same procedures used in experimental analysis. This leads to inferred measures of the defect content that we are able to compare with the exact data. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Modeling and Simulation, Characterization, Mechanical Properties |