| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Atom Probe Tomography for Advanced Characterization of Metals, Minerals and Materials III
|
| Presentation Title |
APT for Atomic-scale Insights to the Origins of Materials Properties |
| Author(s) |
Michael Moody, Paul Bagot, Tom Lapington, David Tweddle, Benjamin Jenkins |
| On-Site Speaker (Planned) |
Michael Moody |
| Abstract Scope |
Increasingly, across a wide-range of material research problems, further advances in material performance now requires understanding of microstructure at the atomic scale. APT routinely provides unique insight into 3D chemical distributions within materials at a scale that even the most advanced electron microscopes cannot routinely achieve.
This presentation will highlight three examples where critical nanoscale information provided by APT can be directly correlated to properties to support the further design of material composition and processing and thereby optimise performance. This includes: the evolution of solute clusters in the microstructure of steels designed as components for fission reactors; electrical properties of gettered/passivated multi-crystalline silicon; and oxidation performance of a series of Ni-based superalloys systematically varying in Ti and Nb content. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |