About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
|
Symposium
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ICME Gap Analysis in Materials Informatics: Databases, Machine Learning, and Data-Driven Design
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Presentation Title |
L-21 (Digital): Deep Learning Image Analysis for Lattice Material Qualification |
Author(s) |
Ben White, Anthony Garland, Brad Boyce, Bradley Jared, David Saiz, Michael Heiden, Matthew Roach, David Moore |
On-Site Speaker (Planned) |
Ben White |
Abstract Scope |
Additively manufactured lattice metamaterials expand the range of accessible material properties. The mechanical properties of lattices are highly dependent on the additive manufacturing process so that a variation in the process settings such as laser power or scan rate can radically change bulk lattice material properties. Non-destructive evaluation of lattices is needed before they can be used as functional parts. In this talk, we show how deep learning image analysis can be applied to lattice metamaterial qualification. Using a single image of a lattice before physical testing, the quality of the print and thereby the properties of the lattice can be estimated. Transfer learning and data augmentation enable successful training and validation of our machine learning model with only 48 lattice samples. This demonstration of non-destructive evaluation shows how deep-learning can provide valuable insight to material engineers. SNL is managed and operated by NTESS under DOE NNSA contract DE-NA0003525. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |