| About this Abstract |
| Meeting |
Additive Manufacturing Benchmarks 2022 (AM-Bench 2022)
|
| Symposium
|
Additive Manufacturing Benchmarks 2022 (AM-Bench 2022)
|
| Presentation Title |
Non-destructive, Low-cost Qualification of AM Material and Processes Using RF Measurements |
| Author(s) |
Nandagopal Matavalam, Paul Carriere, Pedro Frigola, Sergey Kutsaev, Alexander Smirnov, Aurora Araujo |
| On-Site Speaker (Planned) |
Nandagopal Matavalam |
| Abstract Scope |
Characterization and quality control of a given AM material and process has been of interest over the past decade. Although parts with complex geometries can be easily printed, characterizing internal features is often difficult and/or expensive. This problem is often solved by incorporating external witness features on the part as well as separate parts in the build such as tensile specimens. In this presentation, we will present ongoing efforts to qualify the finish and geometric accuracy of a given material, machine and post-process using a low-cost RF test specimen. Our non-destructive measurement provides information regarding the geometry and finish of inaccessible internal features and can be repeated throughout the manufacturing sequence. We will discuss how this method has been applied to various materials (copper, niobium, aluminum, titanium); processes (SLA, EB-PBF, L-PBF) and finishing methods (abrasive, chemical, electropolishing). Strategies to scale this approach for end-to-end quality control will also be discussed. |
| Proceedings Inclusion? |
Undecided |