About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
|
Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
Presentation Title |
K-1 (Digital): Computational Polarized Light Microscopy for Large Area Orientation Determination of Uniaxial Materials |
Author(s) |
Ke-Wei Jin, Marc De Graef |
On-Site Speaker (Planned) |
Ke-Wei Jin |
Abstract Scope |
Uniaxial materials such as alpha-titanium exhibit anisotropic optical properties. When illuminated using polarized light, grains of different crystallographic orientation reflect light differently, resulting in different intensities of recorded light. This behavior can be used to determine the c-axis orientation of titanium grains. Compared to other techniques for orientation determination such as EBSD, computational polarized light optical microscopy (CPLM) is low cost and has the ability to accommodate large samples. When used in conjunction with a forward model (FM), the speed of CPLM can be further increased. We will present the use of CPLM to perform orientation determination for large area sample cross-sections. Grain orientations determined using CPLM will be compared to orientations determined from EBSD. Finally, texture analysis will be used to analyze the large sample area. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |