| About this Abstract |
| Meeting |
MS&T23: Materials Science & Technology
|
| Symposium
|
Advances in Dielectric Materials and Electronic Devices
|
| Presentation Title |
Electrical-lead-related Stray Inductance Causing Overassessment of the Electrical Resistance Measured by Using the Two-probe Method |
| Author(s) |
Deborah D.L. Chung, Min Kyoung Kim |
| On-Site Speaker (Planned) |
Deborah D.L. Chung |
| Abstract Scope |
The measurement of the electrical resistance is basic to electrical characterization. The two-probe resistance is known to overassess the resistance, due to the electrode-specimen contact resistance. The four-probe resistance essentially excludes this resistance. However, the two-probe method is commonly used, due to its implementation simplicity. In this method, the current passes through specimen and leads. This work shows that the lead-related stray inductance causes large additional overassessment of the two-probe resistance, particularly when the low-resistance electrical leads emanating from the specimen (not necessarily magnetic) and the electrical clipping for connection to the wires entail changes in the current direction. The inductance and two-probe resistance increase with the lead length, not because of the lead resistance, but because of the lead-related inductance. The inductance increasing by ≤61% causes the two-probe resistance to increase by ≤210%. This additional source of overassessment of the two-probe resistance has not been previously reported. |