About this Abstract |
Meeting |
TMS Specialty Congress 2025
|
Symposium
|
3rd World Congress on Artificial Intelligence in Materials & Manufacturing (AIM 2025)
|
Presentation Title |
Deep Learning-Based Analysis of XRD Patterns for SOEC Cell Performance Evaluation |
Author(s) |
Hunmin Park, Sun-Dong Kim, Yoonseok Choi |
On-Site Speaker (Planned) |
Hunmin Park |
Abstract Scope |
X-ray diffraction (XRD) is a crucial tool for characterizing crystallinity, but conventional methods struggle to analyze complex material compositions in solid oxide electrolysis cells (SOECs). Recently, artificial intelligence (AI), particularly convolutional neural networks (CNNs), has shown promise in enhancing XRD pattern interpretation.
In this study, we applied deep learning techniques to analyze XRD data from SOEC cells after 1,000 hours of operation. CNN-based models effectively detected subtle structural changes and established correlations with performance degradation. Our results demonstrate that deep learning enables meaningful insights beyond conventional analysis, offering a powerful tool for SOEC material diagnostics. While AI applications in SOEC research remain limited, our study highlights its potential for improving material characterization and performance evaluation, paving the way for advanced analytical methodologies in the field. |
Proceedings Inclusion? |
Undecided |