| Abstract Scope |
Plastic deformation in metals predominantly occurs through crystallographic slip, which requires identification to advance the understanding of metals. Current identification methods include (i) the use of the Schmid Factor (SF), (ii) matching of observed experimental slip traces to theoretical slip traces as determined by, e.g., EBSD and, (iii) calculation and matching of the ‘Relative Displacement Ratio’ (RDR) along a pre-determined slip trace, derived from SEM-DIC data. However, these methods require the presence of clear and straight slip traces in the strain field. To identify plasticity which involves, e.g., cross-slip, curved slip, and/or diffuse slip, a method is required that performs a one-step identification, locally, on the SEM-DIC displacement/strain field, i.e., without requiring an initial identification of slip trace lines in the strain map. We developed a method that yields quantitative slip system activity fields directly from DIC (and EBSD) data, which is validated on challenging FCC and BCC case-studies. |