| About this Abstract |
| Meeting |
Additive Manufacturing Benchmarks 2022 (AM-Bench 2022)
|
| Symposium
|
Additive Manufacturing Benchmarks 2022 (AM-Bench 2022)
|
| Presentation Title |
In-Situ Spatial Monitoring and Layer-to-Layer Control of Additive Manufacturing Processes |
| Author(s) |
Robert Landers, Douglas Bristow, Edward C. Kinzel, Cody S. Lough, Tengfei Luo, Sandipan Mishra |
| On-Site Speaker (Planned) |
Robert Landers |
| Abstract Scope |
Additive Manufacturing (AM) is a disruptive class of manufacturing processes that fabricates parts with complex geometries, uses minimal tooling, and can potentially tailor mechanical properties locally. However, achieving accurate geometries with AM processes is challenging due to variability (e.g., changes in part thermal characteristics, material composition, scan path) and that the process is prone to defects (e.g., porosity). This has led to significant research efforts into in-situ monitoring and control. In this talk, we will discuss the use of radiometric measurements (infrared imaging and optical emission spectroscopy) to generate features related to part microstructural properties and laser line scanners to provide morphological spatial properties during the process. These spatial measurements provide the basis for our work in layer-to-layer control where in-situ data is used to intelligently adjust process parameters between layers. In this talk we will provide examples from laser metal deposition, selective laser melting, and digital forming of glass. |
| Proceedings Inclusion? |
Undecided |