| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Spectroscopic Methods and Analysis for Nuclear Energy Related Materials
|
| Presentation Title |
Nano-scale Orientation Mapping Using Electron Backscatter Diffraction |
| Author(s) |
Junliang Liu, Longfei Liu, Hyunseok Oh, Haiming Wen, Adrien Couet |
| On-Site Speaker (Planned) |
Junliang Liu |
| Abstract Scope |
Electron Backscatter Diffraction (EBSD) has been a crucial technique in materials characterization, providing important information related to crystallography. Conventional EBSD has a spatial resolution of approximately 50 nm, mainly limited by the electron beam size, the interaction volume of the electron beam with the sample, and the EBSD detector efficiency, making it challenging to analyze nanocrystalline materials. Utilizing the latest generation CMOS EBSD detector, we present our recent results on orientation mapping on bulk samples at the nanoscale. Using zirconium oxides as an example, known for their complex nano-crystalline microstructure and intricate phase distribution, the CMOS EBSD can generate grain morphology and phase maps comparable to those from Transmission Kikuchi Diffraction (TKD). Case studies on nanocrystalline microstructures in high-entropy alloys and highly-deformed metals, and tips for better sample preparation for EBSD analysis will also be presented. |
| Proceedings Inclusion? |
Planned: |