| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2025: In-Situ Characterization Techniques
|
| Presentation Title |
Local Electrical Characterization of Grain and Phase Boundaries in Alloys |
| Author(s) |
Hanna Bishara |
| On-Site Speaker (Planned) |
Hanna Bishara |
| Abstract Scope |
Grain and phase boundaries significantly affect the electrical properties of metallic materials systems. The interfacial resistivity contributions are generally captured through averaging over multiple defects having different structural characteristics. However, different boundary types exhibit distinct structural characteristics, their electrical properties are expected to span over a spectrum of values. In this study, the resistivities of individual grain and phase boundary segments, having well-defined structures, are directly measured through novel high-resolution local electrical measurements in-situ scanning electron microscopy (SEM). The lecture introduces studies on pure metals and alloys. The resistivities of specific grain boundary segments are reported and correlated with the interface structural characteristics (assessed by advanced microscopy) and its thermodynamic excess properties. Additionally, phase boundary resistivities are associated with their orientation-relationship. The novel results contribute to a better understanding of the defects’ resistivity, which paves the way for knowledge-based defect engineering of conductors and conductive smart materials. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Electronic Materials, Thin Films and Interfaces |