| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Real Time Imaging
|
| Presentation Title |
Using Lock-in Thermography to Rapidly Screening Thermal Property of Additive Manufacturing Components |
| Author(s) |
Zilong Hua, Patrick Merighe, Jorgen Rufner, Arin Preston, Amey Khanolkar, Asa Monson, William Chuirazzi, Michael McMurtrey, David Hurley |
| On-Site Speaker (Planned) |
Zilong Hua |
| Abstract Scope |
Thermal transport properties are among the most important physical properties in energy related applications as they directly tie to energy transport efficiency. Moreover, they are sensitive to the existences of defects and thus can be used to characterize microstructure. Here we report using an improved Lock-in Infrared Thermography (LIT) to rapidly measure/map thermal properties and characterize the microstructure defects, such as porosities, of Additive Manufacturing (Directed Energy Deposition) produced materials. X-ray computer tomography and other mechanical testing were also conducted to provide reference information of the samples. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Additive Manufacturing, Characterization, Other |