| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Mechanical Behavior at the Nanoscale V
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| Presentation Title |
Quantitative Analysis on Deformation of a Cu/Cu45Zr55 Multilayered Structure Combining In-Situ Transmission Electron Microscopy and a Finite Element Model |
| Author(s) |
Yucong Gu, Qianying Guo, Gregory B. Thompson, Lin Li |
| On-Site Speaker (Planned) |
Yucong Gu |
| Abstract Scope |
We perform a quantitative analysis on the deformation of an amorphous Cu45Zr55/crystalline Cu multilayer, combining in-situ transmission electron microscopy and a finite element model (FEM). The experimental load-displacement curve upon indenting the multilayer exhibits an elastic-perfect plastic flow. The top amorphous layer accommodates the deformation via severe strain localization, indicative of shear banding; while the crystalline layers undergo grain rotation, recorded by precession electron diffraction. The FEM replicates the experimental setup, reproducing the load-displacement curve before perfect plastic flow, and detailing the stress field underneath indenter that initiates the incipient plasticity. The FEM results suggest that despite the higher stress concentration in the top amorphous layer, the crystalline layer is likely to yield first. Catastrophic shear bands form after the micro-yielding of top crystalline and amorphous layers. Deformation vector field from FEM suggests the global texture change and grain rotation are the direct results of indentation-induced deformation. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |