About this Abstract |
Meeting |
TMS Specialty Congress 2025
|
Symposium
|
8th World Congress on Integrated Computational Materials Engineering (ICME 2025)
|
Presentation Title |
Investigation of Sources of Discrepancies in Crystal Plasticity Simulations by
Leveraging High-Fidelity Characterization Datasets
|
Author(s) |
Saikumar Reddy Yeratapally, George Weber, Diwakar Naragani, Paul Shade, Edward Glaessgen |
On-Site Speaker (Planned) |
Saikumar Reddy Yeratapally |
Abstract Scope |
The advent of high-fidelity characterization techniques has provided valuable insights into the influence of microstructure on deformation and damage accumulation in polycrystalline alloys. Concurrently, the development of crystal plasticity (CP) models has provided complementary insights into various attributes (e.g. accumulation and evolution of subsurface plastic strain) that cannot be readily measured using advanced characterization techniques. However, missing physics, ignoring residual stresses, applying incorrect boundary conditions, and ignoring subsurface microstructure can lead to discrepancies between measurements and predictions from CP simulations. This presentation focuses on demonstrating how each of the aforementioned factors can result in discrepancies while predicting elastic modulus, grain-average elastic strains, stress relaxation and active slip systems. Validation data obtained from various high-fidelity measurements like high-energy X-Ray diffraction microscopy and high-resolution digital image correlation were used. |
Proceedings Inclusion? |
Undecided |