| About this Abstract |
| Meeting |
TMS Specialty Congress 2025
|
| Symposium
|
The 7th International Congress on 3D Materials Science (3DMS 2025)
|
| Presentation Title |
Uncertainty in High-Angular-Precision 3D-EBSD Orientation Measurements Using Spherical Harmonic Indexing and Global Pattern Center Optimization on Deformed and Undeformed Samples |
| Author(s) |
Gregory E. Sparks, Michael D. Uchic, Paul A. Shade, Mark Obstalecki |
| On-Site Speaker (Planned) |
Gregory E. Sparks |
| Abstract Scope |
In previous work, we demonstrated the use of high-precision EBSD orientation measurements from spherical harmonic indexing (SHI) combined with global pattern center (PC) optimization in 3D-EBSD reconstruction of an undeformed Ni superalloy sample. In this talk, we discuss the layer-to-layer consistency of the orientations measured using this technique both from the previous undeformed sample and a separate, deformed Ni superalloy sample, and compare this with the consistency of repeated measurements on a single layer for both samples. We also investigate the difference between orientation measurements from a Si wafer at 70° tilt (using the same technique of high-precision SHI with PC optimization) and orientation measurements from the same Si wafer at 0° tilt (obtained from matching experimental electron channeling patterns (ECP) with simulated ECP) as a potential explanation for residual rigid-body orientation errors in 3D-EBSD relative to other orientation measurement modalities. |
| Proceedings Inclusion? |
Undecided |