About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
3D Statistics of Slip Localization: Analysis of Dual HR-DIC / 3D-EBSD Experiments |
Author(s) |
Toby Francis, Jean-Charles Stinville, Marie-Agathe Charpagne, Andrew Polonsky, McLean Echlin, Jonathan Hestroffer, Valéry Valle, Irene Beyerlein, Tresa Pollock |
On-Site Speaker (Planned) |
Toby Francis |
Abstract Scope |
Characterizing the role of microstructural features in the localization of plasticity is critical to the study of fatigue crack initiation in polycrystalline metals. Three-dimensional serial-sectioning electron backscatter diffraction (3D-EBSD) allows for the accurate characterization of microstructural environments, but provides limited information about deformation. High-resolution digital image correlation (HR-DIC), on the other hand, has the ability to accurately quantify slip localization on specimen surfaces during deformation. This talk will focus on the development of dual HR-DIC / 3D-EBSD experiments, in which HR-DIC measurements are made in-situ prior to 3D tomography performed by the TriBeam method. Efficient codes for merging and analyzing the results of the experiment will be discussed. 3D spatial statistics regarding the propensity for primary and secondary slip around twins, triple junctions, and quadruple points in Inconel 718 will be presented. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |